Flexibly-wrapped integrated circuit die

ABSTRACT

Embodiments of a flexibly-wrapped integrated circuit die device and a method for mounting a flexibly-wrapped integrated circuit die to a substrate are disclosed. In some embodiments, the flexibly-wrapped integrated circuit die device includes a substrate and a flexible integrated circuit die coupled to the substrate in a substantially vertical orientation with reference to a surface of the substrate.

This application is a divisional of U.S. patent application Ser. No.14/368,434, filed on Jun. 24, 2014, which is a U.S. National StageFiling under 35 U.S.C. §371 from International Patent Application SerialNo. PCT/US2013/076397, filed on Dec. 19, 2013, the benefit of priorityof which each is claimed hereby, and each is incorporated by referenceherein in its entirety.

TECHNICAL FIELD

Embodiments described herein generally relate to integrated circuits.Some embodiments relate to integrated circuit bonding.

BACKGROUND

As manufacturers attempt to reduce the size of electronic devices, theymay find ways to combine integrated circuit dies in order to make theelectronics of the device more compact. One typical way to connectmultiple integrated circuit dies may be to stack the dies vertically astiers, using vias to connect the circuitry between the tiers of dies.This may result in the heat generated by the circuitry of a lowersubstrate propagating upwards through the stacked dies. This may add tothe heat already generated by the circuitry of the upper tiers of dies,thus decreasing the reliability of the upper tiers of dies.

Another method may locate dies side-by-side and use wire bonding toconnect circuits between each. This may result in longer bond wires thatmay be more susceptible to breakage as well as a larger total packagesize.

There are general needs for combining multiple integrated circuits in arelatively small package.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates an embodiment of a flexibly-wrapped integratedcircuit die.

FIG. 2 illustrates an embodiment of the flexibly-wrapped integratedcircuit die formed around a stack of integrated circuit dies.

FIG. 3 illustrates an embodiment of the flexibly-wrapped integratedcircuit die with an antenna.

FIG. 4 illustrates an embodiment of the flexibly-wrapped integratedcircuit die with shielding.

FIG. 5 illustrates an embodiment of the flexibly-wrapped integratedcircuit die with edge connections.

FIG. 6 illustrates an embodiment of a method for connecting theflexibly-wrapped integrated circuit die to another substrate.

FIGS. 7A-7D illustrate embodiments of a stacked stud connection on aflexibly-wrapped integrated circuit die.

FIG. 8 illustrates an embodiment of alignment pillars.

DETAILED DESCRIPTION

The following description and the drawings sufficiently illustratespecific embodiments to enable those skilled in the art to practicethem. Other embodiments may incorporate structural, logical, electrical,process, and other changes. Portions and features of some embodimentsmay be included in, or substituted for, those of other embodiments.Embodiments set forth in the claims encompass all available equivalentsof those claims.

Subsequent discussions refer to integrated circuit dies. The termintegrated circuit die may refer to not only the electrical circuitrybut also any film, substrate (e.g., silicon), and/or other material usedto mount the circuitry. Thus, as used herein, an integrated circuit diemay include an electrical circuit formed on or as part of the substrate,the film, and/or any other material for mounting circuitry.

Multiple integrated circuit dies may be combined by stacking theintegrated circuit dies vertically in a tiered structure. The integratedcircuit dies may then use vias to connect circuitry on a first tier tocircuitry on other tiers that are above and/or below the first tier.

This orientation may result in heat from circuitry operating on a lowerintegrated circuit die propagating through the upper integrated circuitdies. When this additional heat is added to the heat of the operatingcircuitry of the upper integrated circuit dies, it may result inheat-related problems and increased failure rates for circuit elementsin the upper integrated circuit dies.

These problems may be reduced by wrapping a relatively thin, verticallyoriented integrated circuit die around one or more horizontally orientedintegrated circuit dies. For example, by reducing the thickness of aflexibly-wrapped integrated circuit die to a thickness that enables itto bend and flex (e.g., for Si dies less than 50 μm thick; for other dieor die substrate materials, different thickness limits may apply), theflexibly-wrapped integrated circuit die may be bonded in the verticalorientation peripherally around the edges of one or more horizontallyoriented integrated circuit dies. Heat produced by circuitry on theflexibly-wrapped integrated circuit die may be emitted upwards and awayfrom the horizontally oriented integrated circuit die(s).

While reference is made herein to the vertically oriented,flexibly-wrapped integrated circuit die and the horizontally orientedintegrated circuit die(s) (and the substrate to which the die(s) areattached), the present embodiments are not limited to an exactlyorthogonal relationship between the two dies. For example, thevertically oriented, flexibly-wrapped integrated circuit die may be atan angle other than 90° in relation to the substrate or package to whichit is mounted and to the integrated circuit die(s) around which theflexibly-wrapped integrated circuit die may be peripherally wrapped.

FIG. 1 illustrates an embodiment of a flexibly-wrapped integratedcircuit die 100 device. The device may include the flexibly-wrappedintegrated circuit die 100 mounted on a substrate or package 115.

The flexibly-wrapped integrated circuit die 100 may have a reducedthickness in order to enable it to bend enough to be formed in an arc, acircular segment, a circle, an oval, or some other shape. Theflexibly-wrapped integrated circuit die 100 may comprise a circuit(e.g., traces, vias, electronic components) formed on or part of a film,a substrate (e.g., silicon, germanium), or some other die material.

The flexibly-wrapped integrated circuit die 100 may be formed within thepackage 115 that may provide one or more of structural protection,environmental protection, shielding, and/or heat sink capabilities. Thebottom of the package 115 may be a substrate or may be attached to asubstrate. The package 115 may substantially enclose theflexibly-wrapped integrated circuit die 100 device.

FIG. 1 also illustrates that horizontally oriented integrated circuitdies may not be used in some embodiments. For example, theflexibly-wrapped integrated circuit die 100 may be formed substantiallyas shown without the horizontally oriented integrated circuit dies. Inan embodiment, bonding wires 121 may couple circuitry from theflexibly-wrapped integrated circuit die 100 to the substrate or package115 where a circuit may be mounted.

The flexibly-wrapped integrated circuit die 100 may be formed in acomplete circuit such that the ends of the flexibly-wrapped integratedcircuit die 100 meet and may be connected together. Another embodimentmay include a gap between the ends of the flexibly-wrapped integratedcircuit die 100, such as the gap shown in FIG. 1. In such an embodiment,one or more bonding wires 120 may be used to bridge the gap and connectthe circuitry if one or more circuits need to be completed. In anotherembodiment, the flexibly-wrapped integrated circuit die 100 may formonly an arc or curved form.

In another embodiment, the flexibly-wrapped integrated circuit die 100may comprise a segmented substrate material (e.g., a plurality of linkedshorter segments) wherein each segment may not be thin enough to beflexible individually but together may mimic a flexibly-wrappedintegrated circuit die 100. Another embodiment may use an integratedcircuit die 100 that is initially flexible but may then be hardened intoan arc, curve, or circular shape that is no longer flexible once formedin a desired shape and location.

One side of the flexibly-wrapped integrated circuit die 100 may be anactive side 111 while the other side may be an inactive side 110. Theactive side may include a majority of the electronic circuitry thatincludes circuit traces, and/or circuit elements (e.g., transistors,interconnects, capacitors, resistors, logic elements). The inactive side110 may include a lesser amount of the electronic circuitry.

FIG. 2 illustrates an embodiment of the flexibly-wrapped integratedcircuit die 100 formed around horizontally oriented integrated circuitdie(s) 200 (e.g., stack of integrated circuit dies, substrates, and/orelectrical components).

The stack of integrated circuit die(s) 200 may be coupled togethermechanically as well as electrically through solder balls and bondingwires 205. Vias may electrically connect the circuits of the differenttiers of dies and/or substrates. If the bottom of the package 115comprises a substrate with a circuit, the horizontally orientedintegrated circuit die(s) 200 may be coupled to that circuit with one ormore bonding wires 205.

Circuitry on the active side 111 of the flexibly-wrapped integratedcircuit die 100 may be coupled to the horizontally oriented integratedcircuit die(s) 200 by one or more bonding wires 203. The circuitry onthe active side 111 of the flexibly-wrapped integrated circuit die 100may also be coupled to circuitry on the substrate and/or package 115 byone or more bonding wires 121.

FIG. 3 illustrates an embodiment of the flexibly-wrapped integratedcircuit die 100 having an antenna 300. The antenna 300 may be mounted onthe inactive side 110 (e.g., outer side) of the flexibly-wrappedintegrated circuit die 100. The antenna 300 may be electrically coupledto circuitry on the active side 111 by a via or jumper wire. The antenna300 may also be electrically coupled to the horizontally orientedintegrated circuit die(s) 200 by a bonding wire 310 coupled to a via.

The antenna 300 may be configured to radiate a signal outwards thusleaving the horizontally oriented integrated circuit die(s) 200undisturbed. This may be accomplished by forming a shield layer betweenthe antenna 300 and the inactive side 110 of the flexibly-wrappedintegrated circuit die 100. In an embodiment, the antenna 300 may bepart of or combined with shielding 400 as illustrated in FIG. 4.

The antenna 300 may be a metal that has been formed on theflexibly-wrapped integrated circuit die 100 by an etching process or ametal deposition process. The antenna 300 may also be an antenna elementthat is electrically and/or mechanically bonded to the surface of theflexibly-wrapped integrated circuit die 100.

FIG. 4 illustrates an embodiment of the flexibly-wrapped integratedcircuit die 100 having shielding 400, 401. The shielding 400, 401 may bea metal shielding and include shielding on both the inactive surface 110of the flexibly-wrapped integrated circuit die 100 as well as coveringthe top 401 of the flexibly-wrapped integrated circuit die 100.

In an embodiment, only the inactive surface 110 of the flexibly-wrappedintegrated circuit die 100 includes shielding 400. In anotherembodiment, only the top 401 of the flexibly-wrapped integrated circuitdie 100 includes the shielding 401. As discussed previously withreference to FIG. 3, either the top shielding 401 or the side shielding400 may include an antenna 300 formed into the shielding material.

In some embodiments, the flexibly-wrapped integrated circuit die 100 maybe glued, soldered, or bonded in some manner to the package 115, asillustrated previously. FIG. 5 illustrates an embodiment of theflexibly-wrapped integrated circuit die 100 that is attached to thesubstrate or package 115 using edge connections.

For example, a plurality of solder areas (e.g., solder balls) may beattached to a top surface of the substrate or package 115 in aparticular pattern. A lower edge of the flexibly-wrapped integratedcircuit die 100 may have a plurality of landing pads 501 in the sameparticular pattern such that each landing pad corresponds to a solderball location. The flexibly-wrapped integrated circuit die 100 may thenbe lowered on or near the top surface of the substrate or package 115with the corresponding landing pads 501 matching up with the solderballs 500. When the assembly is heated, the solder balls 500 may meltand fuse to its associated landing pad when cooled, thus attaching theflexibly-wrapped integrated circuit die 100 to the substrate or package115.

FIG. 6 illustrates an embodiment of a method for connecting theflexibly-wrapped integrated circuit die 100 to the substrate or package115 or another substrate. A tube 600 may be used to substantiallyencircle the flexibly-wrapped integrated circuit die 100 eithertemporarily during attachment of the flexibly-wrapped integrated circuitdie 100 to the package 115 or permanently bonded to the substrate orpackage 115. The tube 600 may be used during a wire bonding process toreduce cracks that may occur during the bonding process.

The tube 600 may include a material that enables it to act as a heatsink. For example, if the tube 600 is either a metal material or issurfaced with a metal material, the tube 600 may be mechanically coupledto the flexibly-wrapped integrated circuit die 100 and radiate heat awayfrom the flexibly-wrapped integrated circuit die 100.

FIGS. 7A-7D illustrate embodiments of a method for creating a stackedstud connection 705 on a flexibly-wrapped integrated circuit die 100 andplacing a bonding wire between the stacked stud 705 and a horizontallyoriented integrated circuit die 710. The stacked stud connection 705 mayreduce the complexity and increase the reliability of a wire bondingprocess since the wire bonding mechanisms may only have to move in avertical direction. However, such an embodiment is for purposes ofillustration only as another embodiment may bond wire to theflexibly-wrapped integrated circuit die 100 in a substantiallyhorizontal direction as well.

FIG. 7A illustrates an initial step with the flexibly-wrapped integratedcircuit die 100 lying flat. The flexibly-wrapped integrated circuit die100 comprises a plurality of solder pads 700-702. In an embodiment, theplurality of solder pads 700-702 are located on the active side 111 ofthe flexibly-wrapped integrated circuit die 100.

FIG. 7B illustrates a stack 705 of a plurality of solder balls (e.g.,solder bumps) that are formed on one of the solder pads 701. In anembodiment, a metal cylinder or single solder cylinder may be usedinstead of the plurality of solder balls.

FIG. 7C illustrates the flexibly-wrapped integrated circuit die 100being in a substantially vertical orientation and placed near asubstantially horizontal integrated circuit die 710. The substantiallyhorizontal integrated circuit die 710 may comprise a plurality of solderpads 711, 712.

FIG. 7D illustrates a bonding wire 720 being attached to both the stack705 and one of the solder pads 711 on the substantially horizontalintegrated circuit die 710. The bonding of the wire 720 may use awell-known process of heating the solder, placing the wire 720, andletting the solder cool.

The wire bonding process of FIGS. 7A-7D is for purposes of illustrationonly. Other wire bonding processes may be used.

FIG. 8 illustrates an embodiment of alignment pillars for aligning theflexibly-wrapped integrated circuit die 100 to the substrate or package115 to which the flexibly-wrapped integrated circuit die 100 is coupled.The alignment pillars may comprise a plurality of pillars 800-803located in corners of the package 115. Other embodiments may positionmore than four pillars 800-803 and/or in different locations than thecorners of the package 115.

During the bonding process of the flexibly-wrapped integrated circuitdie 100 to other substrates or the package 115, the flexibly-wrappedintegrated circuit die 100 may be positioned within the alignmentpillars 800-803. The alignment pillars 800-803 may then hold theflexibly-wrapped integrated circuit die 100 in that position until it ispermanently attached to the package 115. For example, referring to FIG.5, accurate alignment of the flexibly-wrapped integrated circuit die 100may be desired due to the placement of the solder balls 500 and thelanding pads 501. The pillars 800-803 may be removed after attachment ofthe flexibly-wrapped integrated circuit die 100 or left on the package115 permanently.

If the alignment pillars 800-803 are left permanently, they may serve apurpose other than alignment. For example, the alignment pillars 800-803may serve as heat sinks to remove heat from the flexibly-wrappedintegrated circuit die 100, substrates, or the package 115. Thealignment pillars 800-803 may also be used as antennas, selectiveshielding, and/or to modify an airflow (e.g., cooling fan airflow)around the assembly.

EXAMPLES

The following examples pertain to further embodiments.

Example 1 is an integrated circuit die device comprising a substrate anda flexible integrated circuit die coupled to the substrate in asubstantially vertical orientation with reference to a surface of thesubstrate.

In Example 2, the subject matter of Example 1 can optionally includewherein the curved integrated circuit die comprises a segmentedsubstrate material comprising a plurality of linked segments.

In Example 3, the subject matter of Examples 1-2 can optionally includewherein the curved integrated circuit die comprises an active side andan inactive side.

In Example 4, the subject matter of Examples 1-3 can optionally includewherein the active side comprises additional electronic circuitry withreference to the inactive side.

In Example 5, the subject matter of Examples 1-4 can optionally includebonding wires coupling electronic circuitry on the curved integratedcircuit die to circuitry on the substrate.

In Example 6, the subject matter of Examples 1-5 can optionally includeat least one integrated circuit die coupled to the substrate in asubstantially horizontal orientation with reference to the flexibleintegrated circuit die, wherein the curved integrated circuit die wrapsaround at least a portion of the periphery of the at least oneintegrated circuit die.

In Example 7, the subject matter of Examples 1-6 can optionally includewherein electronic circuitry on the curved integrated circuit die iscoupled to the at least one integrated circuit die with one or morebonding wires.

In Example 8, the subject matter of Examples 1-7 can optionally includewherein the curved integrated circuit die is coupled to the substrate ina circular pattern around the periphery of the at least one integratedcircuit die.

In Example 9, the subject matter of Examples 1-8 can optionally includewherein ends of the curved integrated circuit die are coupled together.

In Example 10, the subject matter of Examples 1-9 can optionally includea shield formed on an inactive side of the curved integrated circuitdie.

Example 11 is a flexibly-wrapped integrated circuit die devicecomprising: a substrate, an integrated circuit die coupled to thesubstrate, and a flexible integrated circuit die, the flexibleintegrated circuit die coupled to the substrate in a substantiallyvertical orientation with reference to a surface of the substratewherein the flexible integrated circuit die substantially peripherallyencircles the integrated circuit die.

In Example 12, the subject matter of Example 11 can optionally includewherein the integrated circuit die coupled to the substrate comprises aplurality of stacked integrated circuit dies.

In Example 13, the subject matter of Examples 11-12 can optionallyinclude a tube coupled to the substrate and substantially encircling theflexible integrated circuit die.

In Example 14, the subject matter of Examples 11-13 can optionallyinclude wherein the flexible integrated circuit die further comprises aplurality of landing pads arranged around a lower edge of the flexibleintegrated circuit die in a particular pattern, each landing pad coupledto a corresponding one of a plurality of solder balls coupled to thesubstrate in the particular pattern.

In Example 15, the subject matter of Examples 11-14 can optionallyinclude wherein the substrate is part of a package that substantiallyencloses the flexibly-wrapped integrated circuit die device.

In Example 16, the subject matter of Examples 11-15 can optionallyinclude alignment pillars coupled to the substrate and configured toalign the flexible integrated circuit die to the substrate.

Example 17 is a method for mounting a flexibly-wrapped integratedcircuit die to a substrate, the method comprising: providing a pluralityof solder areas in a particular pattern on the substrate; aligning eachof a plurality of landing pads, formed in the particular pattern on alower edge of the flexibly-wrapped integrated circuit die, with anassociated one of the plurality of solder areas; and causing each of theplurality of landing pads to fuse with its associated one of theplurality of solder areas.

In Example 18, the subject matter of Example 17 can optionally includestacked studs on the flexibly-wrapped integrated circuit die; andattaching bonding wires from the stacked studs to the substrate.

In Example 19, the subject matter of Examples 17-18 can optionallyinclude wherein forming each of the stacked studs comprises stacking aplurality of solder balls on a solder pad of the flexibly-wrappedintegrated circuit die.

In Example 20, the subject matter of Examples 17-19 can optionallyinclude wherein aligning each of the plurality of landing pads comprisesusing alignment pillars on the substrate to align the flexibly-wrappedintegrated circuit die with the particular pattern of solder areas onthe substrate.

In Example 21, the subject matter of Examples 17-20 can optionallyinclude wherein aligning each of the plurality of landing pads comprisesforming the flexibly-wrapped integrated circuit die within a tubeattached to the substrate.

In Example 22, the subject matter of Examples 17-21 can optionallyinclude coupling ends of the flexible integrated circuit die togetherwith one or more bonding wires.

Example 23 is a flexibly-wrapped integrated circuit die devicecomprising: a package having a substrate on a bottom surface; a flexibleintegrated circuit die, the flexible integrated circuit die coupled tothe substrate in a substantially vertical orientation with reference toa surface of the substrate;

and a shield coupled to the flexible integrated circuit die.

In Example 24, the subject matter of Example 23 can optionally includewherein the package substantially surrounds the flexible integratedcircuit die.

In Example 25, the subject matter of Examples 23-24 can optionallyinclude wherein the package comprises a heat sink capability.

In Example 26, the subject matter of Examples 23-25 can optionallyinclude wherein the package comprises a shielding capability.

In Example 27, the subject matter of Examples 23-26 can optionallyinclude wherein the shield comprises a shield wrapped around theflexible integrated circuit die on an inactive side of the flexibleintegrated circuit die.

In Example 28, the subject matter of Examples 23-27 can optionallyinclude a top shield coupled to a top edge of the shield wrapped aroundthe flexible integrated circuit die.

In Example 29, the subject matter of Examples 23-28 can optionallyinclude alignment pillars coupled to the substrate, the alignmentpillars comprising heat sink capabilities.

In Example 30, the subject matter of Examples 23-29 can optionallyinclude alignment pillars coupled to the substrate, the alignmentpillars comprising an antenna on at least one of the pillars.

In Example 31, the subject matter of Examples 23-30 can optionallyinclude alignment pillars coupled to the substrate wherein the alignmentpillars are configured to direct cooling air around the device.

Example 32 is a flexibly-wrapped integrated circuit die devicecomprising: a package having a substrate on a bottom surface; firstmeans for mounting coupled in a pattern on a top surface of thesubstrate; and a flexible integrated circuit die having second means formounting located along a lower edge in the pattern such that each of thesecond means for mounting corresponds to one of the first means formounting, the flexible integrated circuit die coupled to the substratein a substantially vertical orientation with reference to the topsurface of the substrate.

In Example 33, the subject matter of Example 32 can optionally include 2wherein the first means for mounting comprises a plurality of solderballs and the second means for mounting comprises a plurality of landingpads.

In Example 34, the subject matter of Examples 32-33 can optionallyinclude wherein the flexible integrated circuit die has a thickness in arange of 2-25 mm.

In Example 35, the subject matter of Examples 32-34 can optionallyinclude wherein the flexible integrated circuit die comprises anantenna.

What is claimed is:
 1. An integrated circuit die device comprising: asubstrate; and a curved integrated circuit die coupled to the substratein a substantially vertical orientation with reference to a surface ofthe substrate.
 2. The integrated circuit die device of claim 1 whereinthe curved integrated circuit die comprises a segmented substratematerial comprising a plurality of linked segments.
 3. The integratedcircuit die device of claim 1 wherein the curved integrated circuit diecomprises an active side and an inactive side.
 4. The integrated circuitdie device of claim 3 wherein the active side comprises additionalelectronic circuitry with reference to the inactive side.
 5. Theintegrated circuit die device of claim 1 and further comprising bondingwires coupling electronic circuitry on the curved integrated circuit dieto circuitry on the substrate.
 6. The integrated circuit die device ofclaim 1 and further comprising at least one integrated circuit diecoupled to the substrate in a substantially horizontal orientation withreference to the curved integrated circuit die, wherein the curvedintegrated circuit die wraps around at least a portion of the peripheryof the at least one integrated circuit die.
 7. The integrated circuitdie device of claim 6 wherein electronic circuitry on the curvedintegrated circuit die is coupled to the at least one integrated circuitdie with one or more bonding wires.
 8. The integrated circuit die deviceof claim 6 wherein the curved integrated circuit die is coupled to thesubstrate in a circular pattern around the periphery of the at least oneintegrated circuit die.
 9. The integrated circuit die device of claim 8wherein ends of the curved integrated circuit die are coupled together.10. The integrated circuit die device of claim 1 and further comprisinga shield formed on an inactive side of the curved integrated circuitdie.